OSM Facility | IST

KERN OKM 173

Widefield optical microscope for sample inspection and documentation.

Widefield optical microscope for sample inspection and documentation.

KERN · OKM 173 optical microscope

What it does

The everyday instrument of the facility. Used to inspect a sample before a spectroscopic measurement, locate the region of interest, check preparation quality and document what is there.

Key capabilities

  • Brightfield inspection at several magnifications
  • Locating regions of interest before spectroscopy
  • Image capture and documentation
  • Quick sample quality checks

Applications

Materials · Life sciences · Chemistry · Industrial

Sample types

Slides, sections, films, surfaces, particles and small components.

Technical specifications

ParameterValue
ObjectivesTo be confirmed
Magnification rangeTo be confirmed
IlluminationTo be confirmed
CameraTo be confirmed
Confirmed values are pending from the facility. Nothing here is estimated.